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High-precision semiconductor finished product frame defect detection

High-precision semiconductor finished product frame defect detection

Overview
The final inspection process of high-precision semiconductor finished product frames before leaving factory. After repeated stamping, silver plating, and clearing, there are still many defects on the product surface, such as imprints, contamination, and frame deformation. To ensure the quality of shipped products, re-testing is
required. Manual inspection is time- consuming and labor-intensive, and the inspection accuracy cannot be guaranteed.
Advantages

Efficiency Improvement

Improved final product inspection efficiency by 40%
Reduced costs
Reduced labor cost by 13%
Reduced defect rate
Final product defective rate reduced to 2%
Other Solution