Steps such as appearance quality inspection of silicon wafers in photovoltaic modules, quality inspection of bus strip lead welding, etc. In actual inspection, the defect shape is random, the characteristics are not obviously, and the requirements of "0 missed detections and extremely low false detections" are extremely high due to the problem of lead length. In addition, the production efficiency of manual inspection does not match the market demand. Quality inspection costs are high, and efficiency is low, which brings significant challenges to photovoltaic manufacturers.
